Scanning Probe Microscopy7.5 ECTS credits
The course treats modern scanning probe microscopy (SPM) techniques, primarily scanning tunneling microscopy (STM) and scanning force microscopy (SFM), both regarding theory and practice. The physical foundation and theory of STM and SFM is treated thoroughly, as well as the basic measurement modes. The course also covers advanced measurement and analysis methods, artifacts, as well as manipulation with STM and SFM. Several examples of the use of SPM techniques in current research and industry are given. Finally, an overview of other SPM techniques is given. The course contains several laboratory exercises.
Progressive specialisation: A1N (has only first‐cycle course/s as entry requirements)
Education level: Master's level
Admission requirements: Mathematics 45 ECTS cr., Physics 90 ECTS cr., including the courses Quantum Physics I and Solid State Physics, or similar courses.
Selection is usually based on your grade point average from upper secondary school or the number of credit points from previous university studies, or both.
This course is included in the following programme
- Master of Science in Engineering Physics (studied during year 5)
- Master of Science in Engineering, Degree Programme in Engineering Physics (studied during year 2)