Scanning Probe Microscopy
7.5 ECTS creditsThe course treats modern scanning probe microscopy (SPM) techniques, primarily scanning tunneling microscopy (STM) and scanning force microscopy (SFM), regarding both theory and practice. The physical foundations and theory of STM and SFM are treated thoroughly, as well as basic measurement modes. The course also covers advanced measurement and analysis methods, artifacts, as well as manipulation with STM and SFM. Several examples of the use of SPM techniques in current research and industry are given. Finally, an overview of other SPM techniques is given. The course includes laboratory sessions with mandatory participation.
Course content: Fundamental experimental and technical aspects of scanning probe microscopy.
STM: STM theory, Measurements modes, resolution limits, tunneling spectroscopy, lowtemperature STM, inelastic tunneling, spin-polarised STM. Advanced analysis, electronic and atomic effects, artifacts, manipulation on atomic level.
SFM: Instrumental aspects, including cantilevers deflection sensors and tip preparation. Relevant forces for SFM.
Measurement modes: static and dynamic methods, contact, "tapping" and non-contact methods. Magnetic force measurements. Spectroscopy, advanced analysis, artifacts in SFM. Overview of manipulation and lithography with SFM. Overview of other SPM techniques, including scanning near-field optical microscopy (SNOM).
Course content: Fundamental experimental and technical aspects of scanning probe microscopy.
STM: STM theory, Measurements modes, resolution limits, tunneling spectroscopy, lowtemperature STM, inelastic tunneling, spin-polarised STM. Advanced analysis, electronic and atomic effects, artifacts, manipulation on atomic level.
SFM: Instrumental aspects, including cantilevers deflection sensors and tip preparation. Relevant forces for SFM.
Measurement modes: static and dynamic methods, contact, "tapping" and non-contact methods. Magnetic force measurements. Spectroscopy, advanced analysis, artifacts in SFM. Overview of manipulation and lithography with SFM. Overview of other SPM techniques, including scanning near-field optical microscopy (SNOM).
Progressive specialisation:
A1N (has only first‐cycle course/s as entry requirements)
Education level:
Master's level
Admission requirements:
Mathematics, 45 ECTS credits, and Physics, 60 ECTS credits, including the courses Quantum Physics I, 7.5 ECTS credits, and Solid State Physics, 7.5 ECTS credits, and upper secondary level English 6, or equivalent
Selection:
Selection is usually based on your grade point average from upper secondary school or the number of credit points from previous university studies, or both.
This course is included in the following programme
- Master of Science in Engineering Physics (studied during year 4)
- Master's Programme in Physics - Nanomaterials (studied during year 2)
- Master's Programme in Physics - Theoretical physics (studied during year 2)
- Master of Science in Engineering, Degree Programme in Engineering Physics (studied during year 2)